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Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...
www.dftdigest.com - 2009-02-08
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dft
dich
fault coverage
design
bist
eda
jtag
ibist
isp
design for test
ic design
jtag interface
asic
fault
bsdl
dfm
analog
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