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  1. DFT Digest: Expanding design-for-test in an ever-shring world…

    Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...

    www.dftdigest.com - 2009-02-08

dft1 dich1 fault coverage1 design7 bist1 eda1 jtag1 ibist1 isp4 design for test1 ic design1 jtag interface1 asic1 fault1 bsdl1 dfm1 analog2

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